Design-for-Test (DfT) is essential not only during manufacturing but also throughout an IC’s operational lifetime, for example during repair and maintenance. While high controllability and observability are key objectives of DfT, these capabilities can also introduce security risks, including data-sniffing and data-alteration attacks.
With a focus on DfT, in this course presentation, we will discuss the security risks associated with globally distributed supply chains, approaches for preventing the leakage of sensitive information, and methods for detecting and mitigating malicious activity during IC operation.
Organiser: Erik Larsson, Professor Integrated Electronic Systems, EIT, Lund University
On demand. Send an email to info@sccc.se for more information and terms.
This SCCC course presentation was provided to 50 engineers at AXIS on September 2026.